** MEDIA ADVISORY ** Orion to be Scanned for 3-D Printing Demo

Florida Tech’s Grieves to Discuss Evolution of Manufacturing Jobs

WHAT: The future of manufacturing meets the future of space travel at this unique media event. Media will have the opportunity to witness FARO Technologies Inc. conduct a 3-D laser scan of the Orion crew module replica. Direct Dimensions will discuss how a file is prepared, and Met-L-Flo will highlight how it will use the file to print approximately 150 small-scale replicas of the Orion spacecraft to be displayed and used as giveaways at the Society of Manufacturing Engineer’s upcoming 3-D printing technology event, RAPID, scheduled for May 16-19 at the Orange County Convention Center in Orlando.

Lockheed Martin’s actual Orion exterior crew module has already been scanned and will also be 3-D printed in small scale for the RAPID event. Additionally, Cincinnati Inc. will be using their Big Area Additive Manufacturing technology to print Orion in several large pieces and assemble onsite at RAPID.

WHERE: Kennedy Space Center Visitor Complex

WHEN: 10 a.m. Tuesday, March 1, 2016

MEDIA OPPORTUNITIES: Florida Tech’s Michael Grieves, executive director of the university’s Center for Advanced Manufacturing and Innovative Design (CAMID) and world renowned expert in Product Lifecycle Management, will be among the speakers and be available for interviews. Florida Tech students will be available to discuss how the next generation of manufacturing professionals is being educated on advanced manufacturing technology and applications.

Radio, TV and print media will have access to view, film or photograph the 3-D scan. Following the 3-D scan and press event, representatives from SME, Lockheed Martin, FARO, Direct Dimensions, Inc., Met-L-Flo, Inc., and Cincinnati Inc. will be available for interviews.

For more information, please contact Beth Oates at SME: 313-425-3190 or boates@sme.org.

For additional information about Florida Tech, please contact Adam Lowenstein at 321-674-8964 or adam@fit.edu.


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